> > High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
Навигация по сайту
Последние коментарии
Популярная литература

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Добавлено: 11-04-2014, 19:26
Категория:

Книги

'HighАвтор: R. Dean Adams
Название: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
Издательство: Springer
Series: Frontiers in Electronic Testing
Год: 2002
Формат: PDF
Размер: 10.95 MB
Язык: Английский
Для сайта: MirKnig.com

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.



Вернуться
  • Комментарий: 0
  • Просмотров: 108
Уважаемый читатель, Вы зашли в библиотеку как незарегистрированный читатель.
Мы рекомендуем Вам зарегистрироваться либо войти на сайт под своим именем.


Добавить отзыв или комментарий
Имя:*
E-Mail:*
Введите два слова, показанных на изображении: *